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The Institute for Physics of Microstructures of the Russian Academy of Sciences

- the branch of the Federal research center Institute of Applied Physics of the Russian Academy of Sciences named after A. V. Gaponov-Grekhov

RU

The Institute for Physics of Microstructures of the Russian Academy of Sciences

- the branch of the Federal research center Institute of Applied Physics of the Russian Academy of Sciences named after A. V. Gaponov-Grekhov

Drozdov Mikhail

Drozdov Mikhail

Senior research associate of the Department for technology of nanostructures and devices, PhD in Physics.

Research interests

Semiconductor physics and analytical methods of the solid surface: Auger electron spectroscopy and secondary ion mass spectrometry. Recently, the main direction — setting and research of solid structures by time-of-flight secondary ion mass spectrometry to install TOF. SIMS-5.

Education

  • 1972 — 1977 — study in N. I. Lobachevsky State University of Nizhniy Novgorod.
  • 1979 — 1983 — post graduate study in IAP RAS;
  • 1987 — PhD in Physics (supervisor — A. M. Belyantsev).

Career

  • 1977 — 1993 — engineer, junior research associate, research associate of the IAP RAS;
  • 1994 — present — research associate, senior research associate of the IPM RAS;

Publications

  • S.S.Andreev, A. D. Akhsakhalyan, M. N. Drozdov, N. I. Polushkin, N. N. Salashchenko. High — resolution Auger depth profiling of multilayer structures Mo/Si, Mo/B4C, Ni/C. Thin Solid Films, 1995, v.263, p.169−174.
  • N.I.Polushkin, S. A. Gusev, M. N. Drozdov, Yu. K. Verevkin, V. N. Petryakov. Arrays of magnetic wires created in phase-separating Fe-containing alloys by interference laser irradiation. J. Appl. Phys., 1997, v.81, N8, p.5478.
  • M.N.Drozdov, S. V. Gaponov, S. A. Gusev, E. B. Kluenkov, V. I. Luchin, D. V. Masterov, S. K. Saykov, A. K. Vorobiev. Y-Ba-Cu-O thin film composition formation during magnetron sputtering. IEEE Trans. on Appl. Supercond. 1999, v.9, № 2, p.2371−2374.
  • V.A.Kurnaev, N. N. Trifonov, M. N. Drozdov, N. N. Salashchenko. «On the possibility of the in situ growth control and nondestructive depth profiling of ultrathin multilayer structures using keV hydrogen ions». Vacuum. 2000, Vol. 56, № 4, pp. 253−255 (2000).
  • Pakhomov G. L., Drozdov M. N., Vostokov N. V. Plasma irradiation effects in phthalocyanine films. Applied Surface Science, 2004, Volume/Issue 230/1−4, pp. 241−248.
  • G. L. Pakhomov, M. N. Drozdov, V. V. Travkin. SIMS study of gold/phthalocyanine interface. Applied Surface Science, 2010, v.256, pp.1946−1950.
  • E. Bulska, M. N. Drozdov, G. Mana, A. Pramann, O. Rienitz, P. Sennikov and S. Valkiers. The isotopic composition of enriched Si: a data analysis. Metrologia 48 (2011) S32-S36.
  • P.G. Sennikov, A. V. Vodopyanov, S. V. Golubev, D. A. Mansfeld, M. N. Drozdov, Yu. N. Drozdov, B. A. Andreev, L. V. Gavrilenko, D. A. Pryakhin, V. I. Shashkin, O. N. Godisov, A. I. Glasunov, A. Ju. Safonov, H.-J. Pohl, M. L. W. Thewalt, P. Becker, H. Riemannh, N. V. Abrosimov, S. Valkiers. Towards 0.99999 <28>Si. SolidStateCommunications. 2012, v.152, p.455−457.
  • B. Ber, P. Bábor, P. N. Brunkov, P. Chapon, M. N. Drozdov, R. Duda, D. Kazantsev, V. N. Polkovnikov, P. Yunin, A. Tolstogouzov. Sputter depth profiling of Mo/B4C/Si and Mo/Si multilayer nanostructures: A round-robin characterization by different techniques. Thin Solid Films. 2013, V.540, P.96−105.
  • K.A. Arushanov, M. N. Drozdov, S. M. Karabanov, I. A. Zeltser, A. Tolstogouzov. TOF-SIMS study on surface modification of reed switch blades by pulsing nitrogen plasma. Applied Surface Science 2013, V.265, P.642- 647.
  • E. V. Salomatina, N. M. Bityurin, M. V. Gulenova, T. A. Gracheva, M. N. Drozdov, A. V. Knyazev, K. V. Kir’yanov, A. V. Markina and L. A. Smirnova. Synthesis, structure, and properties of organic-inorganic nanocomposites containing poly (titanium oxide). Journal of Materials Chemistry C, 2013, V. 39, N1, p.6375−6385.

Contact detail

Phone: +7 (831) 417−94−92

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